diff --git a/util/flashrom/flash.h b/util/flashrom/flash.h index da155edfc4..6a1475e47b 100644 --- a/util/flashrom/flash.h +++ b/util/flashrom/flash.h @@ -66,6 +66,7 @@ struct flashchip { #define TEST_OK_READ (1<<1) #define TEST_OK_ERASE (1<<2) #define TEST_OK_WRITE (1<<3) +#define TEST_OK_PREW (TEST_OK_PROBE|TEST_OK_READ|TEST_OK_ERASE|TEST_OK_WRITE) #define TEST_OK_MASK 0x0f #define TEST_BAD_PROBE (1<<4) diff --git a/util/flashrom/flashchips.c b/util/flashrom/flashchips.c index 085a4a7ef5..b26b438c84 100644 --- a/util/flashrom/flashchips.c +++ b/util/flashrom/flashchips.c @@ -49,7 +49,7 @@ struct flashchip flashchips[] = { {"Fujitsu", "MBM29F400TC", FUJITSU_ID, MBM29F400TC_STRANGE, 512, 64 * 1024, TEST_UNTESTED, probe_m29f400bt, erase_m29f400bt, write_coreboot_m29f400bt}, {"Intel", "82802AB", INTEL_ID, 173, 512, 64 * 1024, TEST_UNTESTED, probe_82802ab, erase_82802ab, write_82802ab}, {"Intel", "82802AC", INTEL_ID, 172, 1024, 64 * 1024, TEST_UNTESTED, probe_82802ab, erase_82802ab, write_82802ab}, - {"Macronix", "MX25L3205", MX_ID, MX_25L3205, 4096, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, + {"Macronix", "MX25L3205", MX_ID, MX_25L3205, 4096, 256, TEST_OK_PREW, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, {"Macronix", "MX25L4005", MX_ID, MX_25L4005, 512, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, {"Macronix", "MX25L8005", MX_ID, MX_25L8005, 1024, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, {"Macronix", "MX29F002", MX_ID, MX_29F002, 256, 64 * 1024, TEST_UNTESTED, probe_29f002, erase_29f002, write_29f002}, @@ -76,7 +76,7 @@ struct flashchip flashchips[] = { {"SST", "SST39VF512", SST_ID, SST_39VF512, 64, 4096, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_39sf020}, {"SST", "SST39VF010", SST_ID, SST_39VF010, 128, 4096, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_39sf020}, {"SST", "SST39VF020", SST_ID, SST_39VF020, 256, 4096, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_39sf020}, - {"SST", "SST39VF040", SST_ID, SST_39VF040, 512, 4096, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_39sf020}, + {"SST", "SST39VF040", SST_ID, SST_39VF040, 512, 4096, TEST_OK_PROBE, probe_jedec, erase_chip_jedec, write_39sf020}, // assume similar to 004B, ignoring data sheet {"SST", "SST49LF002A/B", SST_ID, SST_49LF002A, 256, 16 * 1024, TEST_UNTESTED, probe_sst_fwhub, erase_sst_fwhub, write_sst_fwhub}, {"SST", "SST49LF003A/B", SST_ID, SST_49LF003A, 384, 64 * 1024, TEST_UNTESTED, probe_sst_fwhub, erase_sst_fwhub, write_sst_fwhub}, @@ -119,7 +119,7 @@ struct flashchip flashchips[] = { {"SyncMOS", "S29C51004T", SYNCMOS_ID, S29C51004T, 512, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_49f002}, {"Winbond", "W25x10", WINBOND_NEX_ID, W_25X10, 128, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, {"Winbond", "W25x20", WINBOND_NEX_ID, W_25X20, 256, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, - {"Winbond", "W25x40", WINBOND_NEX_ID, W_25X40, 512, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, + {"Winbond", "W25x40", WINBOND_NEX_ID, W_25X40, 512, 256, TEST_OK_PREW, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, {"Winbond", "W25x80", WINBOND_NEX_ID, W_25X80, 1024, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, {"Winbond", "W29C011", WINBOND_ID, W_29C011, 128, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"Winbond", "W29C020C", WINBOND_ID, W_29C020C, 256, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},