Add support for Amic A25L40P SPI flash.

Signed-off-by: Rudolf Marek <r.marek@assembler.cz>
Acked-by: Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>


git-svn-id: svn://svn.coreboot.org/coreboot/trunk@3345 2b7e53f0-3cfb-0310-b3e9-8179ed1497e1
This commit is contained in:
Rudolf Marek 2008-05-22 13:42:23 +00:00 committed by Carl-Daniel Hailfinger
parent 4b1cde877c
commit f40532c2b3
2 changed files with 2 additions and 0 deletions

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@ -117,6 +117,7 @@ extern struct flashchip flashchips[];
#define AMIC_ID 0x7F37 /* AMIC */ #define AMIC_ID 0x7F37 /* AMIC */
#define AMIC_ID_NOPREFIX 0x37 /* AMIC */ #define AMIC_ID_NOPREFIX 0x37 /* AMIC */
#define AMIC_A25L40P 0x2013
#define ASD_ID 0x25 /* ASD, not listed in JEP106W */ #define ASD_ID 0x25 /* ASD, not listed in JEP106W */
#define ASD_AE49F2008 0x52 #define ASD_AE49F2008 0x52

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@ -44,6 +44,7 @@ struct flashchip flashchips[] = {
{"Atmel", "AT49F002(N)", ATMEL_ID, AT_49F002N, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"Atmel", "AT49F002(N)", ATMEL_ID, AT_49F002N, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
{"Atmel", "AT49F002(N)T", ATMEL_ID, AT_49F002NT, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"Atmel", "AT49F002(N)T", ATMEL_ID, AT_49F002NT, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
{"Atmel", "AT25DF321", ATMEL_ID, AT_25DF321, 4096, 256, TEST_OK_PREW, probe_spi_rdid, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, {"Atmel", "AT25DF321", ATMEL_ID, AT_25DF321, 4096, 256, TEST_OK_PREW, probe_spi_rdid, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Amic Technology","A25L40P", AMIC_ID, AMIC_A25L40P, 512, 256, TEST_UNTESTED, probe_spi_rdid, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"EMST", "F49B002UA", EMST_ID, EMST_F49B002UA, 256, 4096, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_49f002}, {"EMST", "F49B002UA", EMST_ID, EMST_F49B002UA, 256, 4096, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_49f002},
{"EON", "EN29F002(A)(N)B", EON_ID, EN_29F002B, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"EON", "EN29F002(A)(N)B", EON_ID, EN_29F002B, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
{"EON", "EN29F002(A)(N)T", EON_ID, EN_29F002T, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"EON", "EN29F002(A)(N)T", EON_ID, EN_29F002T, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},