292 lines
7.6 KiB
C
292 lines
7.6 KiB
C
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/* Copyright 2013 The Chromium OS Authors. All rights reserved.
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* Use of this source code is governed by a BSD-style license that can be
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* found in the LICENSE file.
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*/
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/* Various utility for unit testing */
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#ifndef __CROS_EC_TEST_UTIL_H
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#define __CROS_EC_TEST_UTIL_H
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#include "common.h"
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#include "console.h"
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#include "stack_trace.h"
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/* This allows tests to be easily commented out in run_test for debugging */
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#define test_static static __attribute__((unused))
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#define RUN_TEST(n) \
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do { \
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ccprintf("Running %s...", #n); \
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cflush(); \
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before_test(); \
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if (n() == EC_SUCCESS) { \
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ccputs("OK\n"); \
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} else { \
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ccputs("Fail\n"); \
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__test_error_count++; \
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} \
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after_test(); \
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} while (0)
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#define TEST_ASSERT(n) \
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do { \
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if (!(n)) { \
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ccprintf("%d: ASSERTION failed: %s\n", __LINE__, #n); \
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task_dump_trace(); \
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return EC_ERROR_UNKNOWN; \
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} \
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} while (0)
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#define TEST_OPERATOR(a, b, op, fmt) \
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do { \
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if (!((a) op (b))) { \
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ccprintf("%d: ASSERSION failed: %s " #op " %s\n", \
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__LINE__, #a, #b); \
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ccprintf("\t\tEVAL: " fmt " " #op " " fmt "\n", \
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(a), (b)); \
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task_dump_trace(); \
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return EC_ERROR_UNKNOWN; \
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} \
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} while (0)
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#define TEST_EQ(a, b, fmt) TEST_OPERATOR(a, b, ==, fmt)
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#define TEST_NE(a, b, fmt) TEST_OPERATOR(a, b, !=, fmt)
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#define TEST_BITS_SET(a, bits) TEST_OPERATOR(a & bits, bits, ==, "%u")
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#define TEST_BITS_CLEARED(a, bits) TEST_OPERATOR(a & bits, 0, ==, "%u")
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#define __ABS(n) ((n) > 0 ? (n) : -(n))
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#define TEST_ASSERT_ABS_LESS(n, t) TEST_OPERATOR(__ABS(n), t, <, "%d")
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#define TEST_ASSERT_ARRAY_EQ(s, d, n) \
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do { \
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int __i; \
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for (__i = 0; __i < n; ++__i) \
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if ((s)[__i] != (d)[__i]) { \
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ccprintf("%d: ASSERT_ARRAY_EQ failed at " \
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"index=%d: %d != %d\n", __LINE__, \
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__i, (int)(s)[__i], (int)(d)[__i]); \
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task_dump_trace(); \
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return EC_ERROR_UNKNOWN; \
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} \
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} while (0)
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#define TEST_ASSERT_MEMSET(d, c, n) \
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do { \
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int __i; \
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for (__i = 0; __i < n; ++__i) \
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if ((d)[__i] != (c)) { \
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ccprintf("%d: ASSERT_MEMSET failed at " \
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"index=%d: %d != %d\n", __LINE__, \
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__i, (int)(d)[__i], (c)); \
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task_dump_trace(); \
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return EC_ERROR_UNKNOWN; \
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} \
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} while (0)
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#define TEST_CHECK(n) \
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do { \
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if (n) \
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return EC_SUCCESS; \
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else \
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return EC_ERROR_UNKNOWN; \
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} while (0)
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/* Mutlistep test states */
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enum test_state_t {
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TEST_STATE_STEP_1 = 0,
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TEST_STATE_STEP_2,
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TEST_STATE_STEP_3,
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TEST_STATE_STEP_4,
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TEST_STATE_STEP_5,
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TEST_STATE_STEP_6,
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TEST_STATE_STEP_7,
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TEST_STATE_STEP_8,
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TEST_STATE_STEP_9,
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TEST_STATE_PASSED,
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TEST_STATE_FAILED,
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};
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#define TEST_STATE_MASK(x) (1 << (x))
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/* Hooks gcov_flush() for test coverage report generation */
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void register_test_end_hook(void);
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/*
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* Test initialization. This is called after all _pre_init() calls and before
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* all _init() calls.
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*/
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void test_init(void);
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/** Called before each test. Used for initialization. */
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void before_test(void);
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/** Called after each test. Used to clean up. */
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void after_test(void);
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/* Test entry point */
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void run_test(void);
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/* Test entry point for fuzzing tests. */
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int test_fuzz_one_input(const uint8_t *data, unsigned int size);
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/* Resets test error count */
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void test_reset(void);
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/* Reports test pass */
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void test_pass(void);
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/* Reports test failure */
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void test_fail(void);
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/* Prints test result, including number of failed tests */
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void test_print_result(void);
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/* Returns the number of failed tests */
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int test_get_error_count(void);
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/* Simulates host command sent from the host */
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int test_send_host_command(int command, int version, const void *params,
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int params_size, void *resp, int resp_size);
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/* Optionally defined interrupt generator entry point */
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void interrupt_generator(void);
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/*
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* Trigger an interrupt. This function must only be called by interrupt
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* generator.
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*/
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void task_trigger_test_interrupt(void (*isr)(void));
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/*
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* Special implementation of udelay() for interrupt generator. Calls
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* to udelay() from interrupt generator are delegated to this function
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* automatically.
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*/
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void interrupt_generator_udelay(unsigned us);
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#ifdef EMU_BUILD
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void wait_for_task_started(void);
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void wait_for_task_started_nosleep(void);
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#else
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static inline void wait_for_task_started(void) { }
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static inline void wait_for_task_started_nosleep(void) { }
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#endif
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uint32_t prng(uint32_t seed);
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uint32_t prng_no_seed(void);
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/* Number of failed tests */
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extern int __test_error_count;
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/* Simulates UART input */
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void uart_inject_char(char *s, int sz);
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#define UART_INJECT(s) uart_inject_char(s, strlen(s));
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/* Simulates chipset power on */
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void test_chipset_on(void);
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/* Simulates chipset power off */
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void test_chipset_off(void);
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/* Start/stop capturing console output */
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void test_capture_console(int enabled);
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/* Get captured console output */
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const char *test_get_captured_console(void);
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/*
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* Flush emulator status. Must be called before emulator reboots or
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* exits.
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*/
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void emulator_flush(void);
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/*
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* Entry point of multi-step test.
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*
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* Depending on current test state, this function runs the corresponding
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* test step. This function should be called in a dedicated task on every
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* reboot. Also, run_test() is responsible for starting the test by kicking
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* that task.
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*/
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void test_run_multistep(void);
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/*
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* A function that runs the test step specified in 'state'. This function
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* should be defined by all multi-step tests.
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*
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* @param state TEST_STATE_MASK(x) indicating the step to run.
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*/
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void test_run_step(uint32_t state);
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/* Get the current test state */
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uint32_t test_get_state(void);
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/*
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* Multistep test clean up. If a multi-step test has this function defined,
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* it will be called on test end. (i.e. when test passes or fails.)
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*/
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void test_clean_up(void);
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/* Set the next step and reboot */
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void test_reboot_to_next_step(enum test_state_t step);
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struct test_i2c_read_string_dev {
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/* I2C string read handler */
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int (*routine)(const int port, const uint16_t i2c_addr_flags,
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int offset, uint8_t *data, int len);
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};
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struct test_i2c_xfer {
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/* I2C xfer handler */
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int (*routine)(const int port, const uint16_t i2c_addr_flags,
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const uint8_t *out, int out_size,
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uint8_t *in, int in_size, int flags);
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};
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struct test_i2c_write_dev {
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/* I2C write handler */
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int (*routine)(const int port, const uint16_t i2c_addr_flags,
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int offset, int data);
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};
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/**
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* Register an I2C 8-bit read function.
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*
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* When this function is called, it should either perform the desired
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* mock functionality, or return EC_ERROR_INVAL to indicate it does
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* not respond to the specified port and slave address.
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*
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* @param routine Function pointer, with the same prototype as i2c_xfer()
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*/
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#define DECLARE_TEST_I2C_XFER(routine) \
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const struct test_i2c_xfer __no_sanitize_address \
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__test_i2c_xfer_##routine \
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__attribute__((section(".rodata.test_i2c.xfer"))) \
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= {routine}
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/*
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* Detach an I2C device. Once detached, any read/write command regarding the
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* specified port and slave address returns error.
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*
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* @param port The port that the detached device is connected to
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* @param slave_addr The address of the detached device
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* @return EC_SUCCESS if detached; EC_ERROR_OVERFLOW if too many devices are
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* detached.
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*/
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int test_detach_i2c(const int port, const uint16_t slave_addr_flags);
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/*
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* Re-attach an I2C device.
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*
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* @param port The port that the detached device is connected to
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* @param slave_addr The address of the detached device
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* @return EC_SUCCESS if re-attached; EC_ERROR_INVAL if the specified device
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* is not a detached device.
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*/
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int test_attach_i2c(const int port, const uint16_t slave_addr_flags);
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#endif /* __CROS_EC_TEST_UTIL_H */
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