MX25L3205 and W25x40 have been confirmed to probe/read/erase/write OK

by Harald Gutmann.
SST39VF040 has been confirmed to probe OK by misi e.

Signed-off-by: Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>
Acked-by: Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>


git-svn-id: svn://svn.coreboot.org/coreboot/trunk@3300 2b7e53f0-3cfb-0310-b3e9-8179ed1497e1
This commit is contained in:
Carl-Daniel Hailfinger 2008-05-12 21:19:53 +00:00
parent c95f2a737a
commit 6d3fdf9b62
2 changed files with 4 additions and 3 deletions

View File

@ -66,6 +66,7 @@ struct flashchip {
#define TEST_OK_READ (1<<1)
#define TEST_OK_ERASE (1<<2)
#define TEST_OK_WRITE (1<<3)
#define TEST_OK_PREW (TEST_OK_PROBE|TEST_OK_READ|TEST_OK_ERASE|TEST_OK_WRITE)
#define TEST_OK_MASK 0x0f
#define TEST_BAD_PROBE (1<<4)

View File

@ -49,7 +49,7 @@ struct flashchip flashchips[] = {
{"Fujitsu", "MBM29F400TC", FUJITSU_ID, MBM29F400TC_STRANGE, 512, 64 * 1024, TEST_UNTESTED, probe_m29f400bt, erase_m29f400bt, write_coreboot_m29f400bt},
{"Intel", "82802AB", INTEL_ID, 173, 512, 64 * 1024, TEST_UNTESTED, probe_82802ab, erase_82802ab, write_82802ab},
{"Intel", "82802AC", INTEL_ID, 172, 1024, 64 * 1024, TEST_UNTESTED, probe_82802ab, erase_82802ab, write_82802ab},
{"Macronix", "MX25L3205", MX_ID, MX_25L3205, 4096, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Macronix", "MX25L3205", MX_ID, MX_25L3205, 4096, 256, TEST_OK_PREW, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Macronix", "MX25L4005", MX_ID, MX_25L4005, 512, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Macronix", "MX25L8005", MX_ID, MX_25L8005, 1024, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Macronix", "MX29F002", MX_ID, MX_29F002, 256, 64 * 1024, TEST_UNTESTED, probe_29f002, erase_29f002, write_29f002},
@ -76,7 +76,7 @@ struct flashchip flashchips[] = {
{"SST", "SST39VF512", SST_ID, SST_39VF512, 64, 4096, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_39sf020},
{"SST", "SST39VF010", SST_ID, SST_39VF010, 128, 4096, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_39sf020},
{"SST", "SST39VF020", SST_ID, SST_39VF020, 256, 4096, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_39sf020},
{"SST", "SST39VF040", SST_ID, SST_39VF040, 512, 4096, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_39sf020},
{"SST", "SST39VF040", SST_ID, SST_39VF040, 512, 4096, TEST_OK_PROBE, probe_jedec, erase_chip_jedec, write_39sf020},
// assume similar to 004B, ignoring data sheet
{"SST", "SST49LF002A/B", SST_ID, SST_49LF002A, 256, 16 * 1024, TEST_UNTESTED, probe_sst_fwhub, erase_sst_fwhub, write_sst_fwhub},
{"SST", "SST49LF003A/B", SST_ID, SST_49LF003A, 384, 64 * 1024, TEST_UNTESTED, probe_sst_fwhub, erase_sst_fwhub, write_sst_fwhub},
@ -119,7 +119,7 @@ struct flashchip flashchips[] = {
{"SyncMOS", "S29C51004T", SYNCMOS_ID, S29C51004T, 512, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_49f002},
{"Winbond", "W25x10", WINBOND_NEX_ID, W_25X10, 128, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Winbond", "W25x20", WINBOND_NEX_ID, W_25X20, 256, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Winbond", "W25x40", WINBOND_NEX_ID, W_25X40, 512, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Winbond", "W25x40", WINBOND_NEX_ID, W_25X40, 512, 256, TEST_OK_PREW, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Winbond", "W25x80", WINBOND_NEX_ID, W_25X80, 1024, 256, TEST_UNTESTED, probe_spi, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Winbond", "W29C011", WINBOND_ID, W_29C011, 128, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
{"Winbond", "W29C020C", WINBOND_ID, W_29C020C, 256, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},